The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2023

Filed:

Oct. 29, 2019
Applicant:

Japan Aerospace Exploration Agency, Tokyo, JP;

Inventors:

Seiji Tsutsumi, Chofu, JP;

Miki Hirabayashi, Chofu, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); G01D 21/02 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0221 (2013.01); G01D 21/02 (2013.01); G01D 2218/10 (2021.05);
Abstract

An abnormality detection device includes an acquirer configured to acquire a plurality of detection results of a plurality of sensors that have detected a state of a detection target at predetermined time intervals and an estimator configured to estimate a specific sensor among the plurality of sensors on the basis of a plurality of mode information acquisition process data elements for enabling various types of feature extraction according to properties of the abnormality obtained from a plurality of detection results acquired by the acquirer.


Find Patent Forward Citations

Tsutsumi, Seiji. (2023). Abnormality detection device, abnormality detection method, and program (U.S. Patent No. 11669080). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11669080

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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