The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2023
Filed:
Jan. 17, 2020
Topcon Corporation, Tokyo, JP;
Nobuyuki Nishita, Tokyo, JP;
TOPCON CORPORATION, Tokyo, JP;
Abstract
An apparatus and method are provided that can identify an array direction of a measurement object formed in a linear shape and efficiently perform a localized measurement of the measurement object. A measurement apparatus includes a distance measuring unit, a deflecting unit which deflects a direction of emission of measurement light with respect to a reference optical axis and which is capable of performing scanning with the measurement light with respect to a prescribed center in a circumferential direction, and a calculation control unit which controls the distance measuring unit and the deflecting unit. The calculation control unit detects coordinates of intersection points of a measurement object formed in a linear shape and a scanned trajectory of the measurement light with the basis of a distance measurement result by the distance measuring unit and the direction of emission that is deflected by the deflecting unit, and identifies an array direction of the measurement object on the basis of the coordinates of a plurality of intersection points.