The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2023

Filed:

Nov. 17, 2020
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Philipp Scherz, Linz, AT;

Markus Josef Lang, Pfarrkirchen, AT;

Roland Vuketich, Arbing, AT;

Assignee:

Infineon Technologies AG, Neubiberg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/40 (2006.01); G01S 7/35 (2006.01);
U.S. Cl.
CPC ...
G01S 7/4021 (2013.01); G01S 7/352 (2013.01); G01S 7/4008 (2013.01); G01S 7/4017 (2013.01);
Abstract

A method is proposed for determining at least one calibration parameter for a radar system having a first radar transceiver and a second radar transceiver. The method includes performing a first calibration measurement and a second calibration measurement. The first calibration measurement and the second calibration measurement both include generating a first frequency-modulated oscillation signal and a second frequency-modulated oscillation signal, and combining the first oscillation signal received via the second terminal with the second oscillation signal, in order to generate a first difference signal for the first calibration measurement and a second difference signal for the second calibration measurement, both having a frequency difference between the first oscillation signal and the second oscillation signal. The method also includes determining the at least one calibration parameter based on the two difference signals generated for the first calibration measurement and for the second calibration measurement.


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