The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2023
Filed:
Aug. 27, 2020
Raytheon Technologies Corporation, Farmington, CT (US);
Andrew DeBiccari, Hartford, CT (US);
Zhong Ouyang, Glastonbury, CT (US);
Other;
Abstract
A system for magnetically inspecting a metallic component uses a manipulator configured to manipulate a relative position between a part fixture that holds the metallic component and a probe fixture that holds a magnetic probe, thereby causing the probe tip to trace an inspection route along the surface of the metallic component so that the probe tip contacts the metallic component such that an angular difference between the probe axis and a vector normal to the surface is less than a predetermined angle delta. The magnetic probe has a probe tip that measures magnetic permeability of the metallic component along the inspection route, which the controller receives. A method of performing the magnetic inspection is also disclosed.