The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2023

Filed:

Jan. 19, 2022
Applicant:

Asahi Kasei Microdevices Corporation, Tokyo, JP;

Inventor:

Makoto Kataoka, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/09 (2006.01); G01R 33/00 (2006.01);
U.S. Cl.
CPC ...
G01R 33/093 (2013.01); G01R 33/0011 (2013.01); G01R 33/0035 (2013.01); G01R 33/098 (2013.01);
Abstract

There is provide a magnetic field measurement device including: a magnetic sensor array configured by a plurality of magnetic sensor cells, each of which has a magnetic sensor; a magnetic field acquisition section configured to acquire measurement data measured by the magnetic sensor array; a signal space separation section configured to perform signal separation to separate, into internal space data and external space data, a spatial distribution of a magnetic field which is indicated by the measurement data, based on a position and a magnetic sensitivity of each magnetic sensor; and a calculation processing section configured to remove, from the internal space data, at least a part of a variation component common to magnetic field measurement data that indicates the spatial distribution of the magnetic field which is indicated by the measurement data, and the external space data.


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