The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2023

Filed:

Jun. 23, 2021
Applicant:

Abb Schweiz Ag, Baden, CH;

Inventors:

Alexander Graf, Mannheim, DE;

Stefan Wildermuth, Laudenbach, DE;

Holger Reutner, Eppelheim, DE;

Thomas Stahl, Spechbach, DE;

Sebastian Breisch, Neckarsteinach, DE;

Simon Penner, Osthofen, DE;

Assignee:

ABB Schweiz AG, Baden, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/327 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3274 (2013.01);
Abstract

A contact measurement system for measuring a parameter of a contact of a switchgear includes: a first device for measuring an electrical resistance of the contact and mapping the electrical resistance spatially and/or dynamically; a second device for measuring an axial force of the contact and to map the axial force spatially and/or dynamically as a measured axial force; and a third device for measuring a position of the contact. The contact measurement system determines a position-depending force characteristic based on the measured axial force of the contact and the position of the contact. The contact measurement system determines a status of the contact based on a combination of the position-depending force characteristic with the electrical resistance of the contact.


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