The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2023
Filed:
Jan. 25, 2022
Applicant:
Semitronix Corporation, Hangzhou, CN;
Inventors:
Fan Lan, Hangzhou, CN;
Weiwei Pan, Hangzhou, CN;
Shenzhi Yang, Hangzhou, CN;
Yongjun Zheng, Hangzhou, CN;
Assignee:
SEMITRONIX CORPORATION, Hangzhou, CN;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31722 (2013.01); G01R 31/2882 (2013.01); G01R 31/2886 (2013.01);
Abstract
A test apparatus for testing electrical parameters of a target chip includes: a function generator; a switch matrix module; a plurality of source measurement units (SMUs); at least one of the SMUs is configured to provide power supply for the target chip; at least one of the SMUs is coupled to the switch matrix module; and at least two of said SMUs are test SMUs coupled to ports of the target chip and the function generator.