The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2023

Filed:

Dec. 10, 2021
Applicant:

Electronics and Telecommunications Research Institute, Daejeon, KR;

Inventors:

Chang Hee Hyoung, Daejeon, KR;

Jong Hwa Kwon, Daejeon, KR;

Jung Hwan Hwang, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/28 (2006.01); G01R 29/10 (2006.01);
U.S. Cl.
CPC ...
G01R 29/105 (2013.01);
Abstract

An electromagnetic wave measurement system may include: a reference receiving device; a plurality of auxiliary receiving devices; and a control device connected to the reference receiving device and the plurality of auxiliary receiving devices, wherein the reference receiving device has a wider dynamic range than the plurality of auxiliary receiving devices, the control device collects a frequency-specific measurement value from each of the reference receiving device and the plurality of auxiliary receiving devices, and the frequency-specific measurement value of each of the auxiliary receiving devices is calibrated based on the frequency-specific measurement value of the reference receiving device.


Find Patent Forward Citations

Hyoung, Chang. (2023). Method for measurement of electromagnetic field, and system therefor (U.S. Patent No. 11668741). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11668741

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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