The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2023
Filed:
Sep. 06, 2017
Forschungszentrum Juelich Gmbh, Juelich, DE;
Svetlana Vitusevich, Dueren, DE;
Ihor Zadorozhnyi, Juelich, DE;
FORSCHUNGSZENTRUM JUELICH GMBH, Juelich, DE;
Abstract
An apparatus for measuring electrical potentials of a liquid sample includes at least one field effect transistor having a source, a drain, and a gate, a substrate, and at least two intersecting nanowires of semiconductive material arranged on the substrate, each having a source and drain contact as a field effect transistor and a voltage applicator configured to apply a voltage between the respective source and drain contact. The cross section of the two nanowires has a shape of a triangle or a trapezium. A voltage applicator configured to apply a voltage to the substrate are arranged on the substrate. The nanowires are electrically insulated at least against the sample by a dielectric layer along their surface having a layer thickness between 5 and 40 nm, and at least one impurity is arranged in the dielectric layer as a bearing point which is capable of capturing charge carriers.