The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2023

Filed:

Dec. 01, 2021
Applicant:

Dxcover Limited, Glasgow, GB;

Inventors:

Matthew J. Baker, Glasgow, GB;

Mark Hegarty, Glasgow, GB;

Holly Jean Butler, Glasgow, GB;

David Palmer, Glasgow, GB;

Assignee:

DXCOVER LIMITED, Glasgow, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/25 (2006.01); G01N 21/01 (2006.01); G01N 21/35 (2014.01); G01N 21/552 (2014.01);
U.S. Cl.
CPC ...
G01N 21/253 (2013.01); G01N 21/01 (2013.01); G01N 21/35 (2013.01); G01N 21/552 (2013.01); G01N 2021/3595 (2013.01);
Abstract

A sample slide () for use in a spectrometer (), wherein the sample slide comprises a plurality of sample-receiving portions (-) provided on a sample side () of the slide, and a plurality of beam-receiving portions (-) provided on a beam-receiving side () of the slide, each beam-receiving portion being arranged opposite a respective sample-receiving portion, and wherein each beam-receiving portion is configured to act as an internal reflection element (IRE). A device () for use with a spectrometer () comprises a stage () configured to receive a sample slide (); and a moving mechanism () configured to move the sample slide relative to a sample-measuring location () of the device. Associated methods for preparing a sample and measuring a sample are also disclosed.


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