The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2023
Filed:
Jan. 16, 2019
Exxonmobil Technology and Engineering Company, Annandale, NJ (US);
Lang Feng, New York, NY (US);
Stefan S. Natu, Jersey City, NJ (US);
John J. Valenza, II, Pennington, NJ (US);
ExxonMobil Technology and Engineering Company, Annandale, NJ (US);
Abstract
Methods and apparatus for examining a material are provided. One example method generally includes disposing the material in a dielectric contrast analysis structure, wherein the dielectric contrast analysis structure comprises a bulk dielectric substance and a plurality of receptacles in the bulk dielectric substance, wherein the material is disposed in one or more of the plurality of receptacles; exposing the dielectric contrast analysis structure to incident electromagnetic radiation; detecting resultant radiation from the exposed dielectric contrast analysis structure; and analyzing the detected resultant radiation to estimate at least one of a phase fraction and a phase distribution in the material. One example system generally includes an electromagnetic radiation source; a dielectric contrast analysis structure comprising a bulk dielectric substance and a plurality of receptacles in the bulk dielectric substance for receiving the material; and an electromagnetic radiation detector, wherein the analysis structure is between the radiation source and the detector.