The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2023
Filed:
Mar. 29, 2021
Siemens Healthcare Gmbh, Erlangen, DE;
Magdalena Herbst, Pinzberg, DE;
Ludwig Ritschl, Buttenheim, DE;
Marc Cottiati, Zurich, CH;
Christoph Luckner, Erlangen, DE;
Qi Hu, Erlangen, DE;
Marcel Beister, Erlangen, DE;
Fabian Wloka, Erlangen, DE;
SIEMENS HEALTHCARE GMBH, Erlangen, DE;
Abstract
A method is for making an X-ray recording of an examination region of an examination object with an X-ray system including an X-ray source arranged on an emitter displacement unit and an X-ray detector including a detection area, arranged on a detector displacement unit. The method includes selecting the examination region and portion-wise recording successive recording portions in relation to the examination region. The portion-wise recording includes moving the X-ray source and the X-ray detector, determining a strip-shaped detection region within the detection area, by expanding an extent of the X-ray recording compared with a further different X-ray recording, and acquiring and recording each respective successive recording portion, of the successive recording portions, using the determined detection region and the X-ray source. Finally, the method includes generating an assembled X-ray recording of the examination region from the successive recording portions recorded.