The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2023

Filed:

Feb. 19, 2018
Applicant:

Kyocera Corporation, Kyoto, JP;

Inventors:

Asao Hirano, Tokyo, JP;

Tomoyuki Tougasaki, Sagamihara, JP;

Takeshi Higuchi, Yokohama, JP;

Assignee:

KYOCERA Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/0205 (2006.01); A61B 5/026 (2006.01); A61B 5/1455 (2006.01); A61B 5/00 (2006.01); G01J 3/44 (2006.01); A61B 5/022 (2006.01);
U.S. Cl.
CPC ...
A61B 5/02055 (2013.01); A61B 5/0261 (2013.01); A61B 5/14552 (2013.01); A61B 5/7275 (2013.01); G01J 3/4412 (2013.01); A61B 5/02233 (2013.01); A61B 2562/0233 (2013.01); A61B 2562/0271 (2013.01);
Abstract

A measuring apparatus includes a first laser light source for emitting laser light of a first wavelength, a second laser light source for emitting laser light of a second wavelength different from the first wavelength, an optical detector for receiving scattered laser light from a measured part, and a controller configured to calculate a first value based on an output of the optical detector that is based on received scattered laser light of the first wavelength, calculate a second value based on an output of the optical detector that is based on received scattered laser light of the second wavelength, and measure oxygen saturation based on a ratio of the first value to the second value.


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