The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2023

Filed:

Sep. 24, 2019
Applicant:

Cnh Industrial America Llc, New Holland, PA (US);

Inventors:

Trevor Stanhope, Palos Hills, IL (US);

Joshua David Harmon, Leola, PA (US);

Assignee:

CNH Industrial America LLC, New Holland, PA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A01B 79/00 (2006.01); A01B 63/16 (2006.01); A01B 63/24 (2006.01); A01B 76/00 (2006.01); G01B 11/24 (2006.01); G01B 15/04 (2006.01); A01B 21/08 (2006.01);
U.S. Cl.
CPC ...
A01B 79/005 (2013.01); A01B 63/16 (2013.01); A01B 63/24 (2013.01); A01B 76/00 (2013.01); A01B 21/08 (2013.01); G01B 11/24 (2013.01); G01B 15/04 (2013.01);
Abstract

A system for monitoring the levelness of a multi-wing agricultural implement may include a central frame section, a wing section pivotably coupled to the central frame section and a field contour sensor configured to generate data indicative of a contour of an aft portion of the field located rearward of the implement relative to a direction of travel of the implement. The system may further include a controller communicatively coupled to the field contour sensor. The controller may be configured to monitor the data received from the field contour sensor and assess a levelness of the implement based at least in part on the contour of the aft portion of the field.


Find Patent Forward Citations

Loading…