The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2023
Filed:
May. 16, 2022
Fujifilm Business Innovation Corp., Tokyo, JP;
Toru Misaizu, Kanagawa, JP;
FUJIFILM Business Innovation Corp., Tokyo, JP;
Abstract
An image inspection apparatus includes a processor configured to acquire printing data that is data as a base of an image to be printed, acquire read data that is data obtained by reading the image printed on a paper sheet, specify whether or not the printing data or the read data is an image corresponding to any of an image having a periodic structural feature or an image not having a structural feature, in a case where the printing data or the read data corresponds to the image having the periodic structural feature or the image not having the structural feature, perform registration using a position correction amount that is a correction amount for registering an image based on the printing data and an image based on the read data and is calculated for an already printed image, and inspect the image by comparing the printing data with the read data.