The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2023

Filed:

Mar. 17, 2022
Applicant:

Cisco Technology, Inc., San Jose, CA (US);

Inventors:

Giovanna Carofiglio, Paris, FR;

Jordan François Jean Augé, Saint-Cyr-l-Ecole, FR;

Enrico Loparco, Issy-les-Moulineaux, FR;

Luca Muscariello, Paris, FR;

Assignee:

Cisco Technology, Inc., San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 67/75 (2022.01); H04L 41/5009 (2022.01); H04L 43/0823 (2022.01); H04L 43/0817 (2022.01);
U.S. Cl.
CPC ...
H04L 67/75 (2022.05); H04L 41/5009 (2013.01); H04L 43/0817 (2013.01); H04L 43/0823 (2013.01);
Abstract

In one embodiment, a device determines a first difference between current path measurements and prior path measurements. The device determines a second difference between current predictions and prior predictions made by a prediction model based on path measurements. The device computes, based on the first difference and the second difference, an interest metric for the current path measurements. The device sends at least a portion of the current path measurements for input to the prediction model, when the interest metric exceeds a predefined threshold.


Find Patent Forward Citations

Carofiglio, Giovanna. (2023). Reporting path measurements for application quality of experience prediction using an interest metric (U.S. Patent No. 11665261). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11665261

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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