The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2023
Filed:
Feb. 08, 2022
SK Hynix Inc., Icheon-si, KR;
Meysam Asadi, Fremont, CA (US);
Hongwei Duan, San Jose, CA (US);
Aman Bhatia, Los Gatos, CA (US);
Fan Zhang, Fremont, CA (US);
SK hynix Inc., Icheon-si, KR;
Abstract
Techniques related to improving the error floor performance of a bit flipping (BF) decoder are described. In some examples, error floor performance is improved through determining a set of unreliable check nodes (CNs) and using information about the set of unreliable CNs to compute the flipping energies of variable nodes (VNs). In this manner, the flipping energies can be computed more accurately, thereby lowering the error floor. The set of unreliable CNs can be built through applying various criteria, such as criteria relating to the path length to an unsatisfied CN, the degree of a VN in a path to an unsatisfied CN, and/or checksum value. Path length and VN degree can be applied as selection criteria to determine which CNs qualify as members of the set of unreliable CNs. Checksum value can be applied as a trigger condition for building and/or using the set of unreliable CNs.