The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2023

Filed:

Jun. 17, 2022
Applicant:

Psemi Corporation, San Diego, CA (US);

Inventors:

Jonathan James Klaren, San Diego, CA (US);

David Kovac, Arlington Heights, IL (US);

Eric S. Shapiro, San Diego, CA (US);

Christopher C. Murphy, Lake Zurich, IL (US);

Robert Mark Englekirk, Littleton, CO (US);

Keith Bargroff, San Diego, CA (US);

Tero Tapio Ranta, San Diego, CA (US);

Assignee:

pSemi Corporation, San Diego, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03F 1/22 (2006.01); H03F 3/195 (2006.01); H03F 3/213 (2006.01); H03F 3/24 (2006.01); H03F 1/30 (2006.01); H03F 1/56 (2006.01); H03F 3/193 (2006.01);
U.S. Cl.
CPC ...
H03F 1/223 (2013.01); H03F 1/301 (2013.01); H03F 1/56 (2013.01); H03F 3/193 (2013.01); H03F 3/195 (2013.01); H03F 3/213 (2013.01); H03F 3/245 (2013.01); H03F 2200/102 (2013.01); H03F 2200/105 (2013.01); H03F 2200/165 (2013.01); H03F 2200/18 (2013.01); H03F 2200/21 (2013.01); H03F 2200/222 (2013.01); H03F 2200/225 (2013.01); H03F 2200/243 (2013.01); H03F 2200/294 (2013.01); H03F 2200/297 (2013.01); H03F 2200/301 (2013.01); H03F 2200/306 (2013.01); H03F 2200/387 (2013.01); H03F 2200/391 (2013.01); H03F 2200/399 (2013.01); H03F 2200/42 (2013.01); H03F 2200/451 (2013.01); H03F 2200/48 (2013.01); H03F 2200/489 (2013.01); H03F 2200/492 (2013.01); H03F 2200/498 (2013.01); H03F 2200/555 (2013.01); H03F 2200/61 (2013.01); H03F 2200/78 (2013.01);
Abstract

Bias circuits and methods for silicon-based amplifier architectures that are tolerant of supply and bias voltage variations, bias current variations, and transistor stack height, and compensate for poor output resistance characteristics. Embodiments include power amplifiers and low-noise amplifiers that utilize a cascode reference circuit to bias the final stages of a cascode amplifier under the control of a closed loop bias control circuit. The closed loop bias control circuit ensures that the current in the cascode reference circuit is approximately equal to a selected multiple of a known current value by adjusting the gate bias voltage to the final stage of the cascode amplifier. The final current through the cascode amplifier is a multiple of the current in the cascode reference circuit, based on a device scaling factor representing the relative sizes of the transistor devices in the cascode amplifier and in the cascode reference circuit.


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