The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2023

Filed:

Nov. 13, 2020
Applicant:

Institute of Geology and Geophysics, Chinese Academy of Sciences, Beijing, CN;

Inventors:

Shitou Wu, Beijing, CN;

Yadong Wu, Beijing, CN;

Yueheng Yang, Beijing, CN;

Hao Wang, Beijing, CN;

Chao Huang, Beijing, CN;

Liewen Xie, Beijing, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); G01N 33/24 (2006.01); H01J 49/04 (2006.01); H01J 49/10 (2006.01); H01J 49/16 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0036 (2013.01); G01N 33/24 (2013.01); H01J 49/0463 (2013.01); H01J 49/105 (2013.01); H01J 49/164 (2013.01);
Abstract

The present disclosure provides a method for simultaneously measuring the value of forsterite and trace elements in olivine, comprising the following steps: Step S1: selecting samples, wherein the samples are olivine samples; Step S2: placing the samples in a sample chamber of LA-ICP-MS, and adjusting the position of the samples in the optical axis direction so that the laser beam is well focused; Step S3: optimizing the instrument to make the signal-to-noise ratio ofFe be the best; Step S4: adopting LA-ICP-MS peak hopping mode and receiving all the mass peaks of the samples by single electron multiplier (SEM). The present disclosure overcomes the disadvantages of long test cycle and high test cost in the prior art.


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