The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2023
Filed:
Jun. 17, 2022
Kit Check, Inc., Washington, DC (US);
Jeremy Ian Yanowitz, Washington, DC (US);
Eric Russell Brody, Reston, VA (US);
Christian Lee Doyle, Silver Spring, MD (US);
Michael Christopher Wimpee, Washington, DC (US);
Ramsey Richard Chambers, Reston, VA (US);
Cameron James Alexander Ferroni, Washington, DC (US);
Hannah Margaret Holtzman, Washington, DC (US);
Ross Andrew Reed, Washington, DC (US);
Matthew Jordan Kirk, Kenmore, WA (US);
Lukas Nagel, Washington, DC (US);
Bluesight, Inc., Alexandria, VA (US);
Abstract
A system and method for determining event discrepancies between disparate systems is described. The system can receive sets of events from multiple systems. The system can normalize the sets of events to convert them into normalized events. From a normalized set of events, the system can concurrently generate a plurality of event arrays. The system can apply one or more rules to the event arrays to generate at least one event array parameter.