The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2023

Filed:

Jan. 12, 2021
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Jiaqian Yu, Beijing, CN;

Jingtao Xu, Beijing, CN;

Yiwei Chen, Beijing, CN;

Byung In Yoo, Seoul, KR;

Chang Kyu Choi, Seongnam-si, KR;

Hana Lee, Suwon-si, KR;

Jaejoon Han, Seoul, KR;

Qiang Wang, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/50 (2017.01); H01L 27/146 (2006.01);
U.S. Cl.
CPC ...
G06T 7/50 (2017.01); H01L 27/14605 (2013.01); G06T 2207/10024 (2013.01);
Abstract

A depth estimation method and apparatus are provided. The depth estimation method includes obtaining an image from an image sensor comprising upper pixels, each comprising N sub-pixels, obtaining N sub-images respectively corresponding to the N sub-pixels from the image, obtaining a viewpoint difference between the N sub-images using a first neural network, and obtaining a depth map of the image based on the viewpoint difference using a second neural network.


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