The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2023

Filed:

Oct. 14, 2021
Applicant:

Baker Hughes Oilfield Operations Llc, Houston, TX (US);

Inventors:

Clark A. Bendall, Skaneateles, NY (US);

Matthew W. Pankow, Camillus, NY (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/60 (2017.01); G06T 19/00 (2011.01); G06T 7/55 (2017.01); G06F 3/04812 (2022.01); G06T 19/20 (2011.01);
U.S. Cl.
CPC ...
G06T 7/0006 (2013.01); G06F 3/04812 (2013.01); G06T 7/55 (2017.01); G06T 7/60 (2013.01); G06T 19/006 (2013.01); G06T 19/20 (2013.01); G06T 2200/24 (2013.01); G06T 2207/30164 (2013.01); G06T 2219/012 (2013.01); G06T 2219/2012 (2013.01);
Abstract

A method for is provided. The method can include receiving data characterizing a first measurement image having a first state and a first set of three-dimensional coordinate data corresponding to the first measurement image. The first measurement image can include two-dimensional image data. The method can also include receiving data characterizing at least one geometric dimension determined for the first measurement image. The method can further include receiving data characterizing a second measurement image having a second state and a second set of three-dimensional coordinate data corresponding to the second measurement image. The method can also include applying the first state of the first measurement image to the second measurement image. The method can further include displaying at least one second geometric dimension determined using the second set of three-dimensional coordinate data. Related systems performing the method are also provided.


Find Patent Forward Citations

Loading…