The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2023

Filed:

Nov. 24, 2020
Applicant:

Autodesk, Inc., San Francisco, CA (US);

Inventors:

Shubham Goel, San Francisco, CA (US);

Charis Kaskiris, Berkeley, CA (US);

Patricia Keaney, Greenbrae, CA (US);

Anand Rajagopal, San Francisco, CA (US);

Manu Venugopal, San Francisco, CA (US);

Assignee:

AUTODESK, INC., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/06 (2023.01); G06Q 50/08 (2012.01); G06N 5/04 (2023.01); G06K 9/62 (2022.01); G06N 3/08 (2023.01); G06N 20/00 (2019.01); G06F 30/13 (2020.01); G06Q 10/0635 (2023.01); G06Q 10/0633 (2023.01); G06N 5/046 (2023.01); G06Q 10/0639 (2023.01);
U.S. Cl.
CPC ...
G06Q 10/0635 (2013.01); G06F 30/13 (2020.01); G06K 9/623 (2013.01); G06N 3/08 (2013.01); G06N 5/046 (2013.01); G06N 20/00 (2019.01); G06Q 10/0633 (2013.01); G06Q 10/06395 (2013.01); G06Q 50/08 (2013.01);
Abstract

A system and method provide the ability to control an architecture, engineering, and construction (AEC) project workflow. AEC data regarding a quality of construction is obtained. A set of classifiers and machine learning models are obtained. The AEC data is augmented based on the set of classifiers and machine learning models. A risk metric is generated for one or more issues in the AEC data based on the augmented AEC data. The risk metric is interactively generated and presented on a display device. Work, project resourcing, and/or training are prioritized based on the risk metric.


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