The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2023

Filed:

Mar. 24, 2022
Applicant:

Arize Ai, Inc., Mill Valley, CA (US);

Inventors:

Jason Lopatecki, Mill Valley, CA (US);

Francisco Castillo Carrasco, Mill Valley, CA (US);

Aparna Dhinakaran, Dublin, CA (US);

Michael Schiff, Mill Valley, CA (US);

Assignee:

ARIZE AI, INC., Mill Valley, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06K 9/62 (2022.01); G06F 18/214 (2023.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 18/214 (2023.01);
Abstract

Techniques for determining embedding drift score in a machine learning model. The techniques can include: obtaining one or more first embedding vectors based on at least one first prediction of a machine learning model; filtering the first embedding vectors based on a slice of the first prediction; determining a first average vector by averaging each dimension of the filtered first embedding vectors; obtaining one or more second embedding vectors on at least one second prediction of the machine learning model; filtering the second embedding vectors based on a slice of the second prediction; generating a second average vector by averaging each dimension of the filtered second embedding vectors; and determining an embedding drift score based on a distance measure of the first average vector and the second average vector.


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