The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2023
Filed:
Dec. 15, 2015
Applicant:
Lytx, Inc., San Diego, CA (US);
Inventors:
Quoc Chan Quach, San Diego, CA (US);
Gabriela Surpi, San Diego, CA (US);
Assignee:
Lytx, Inc., San Diego, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 7/01 (2023.01); G06F 9/54 (2006.01);
U.S. Cl.
CPC ...
G06N 7/01 (2023.01); G06F 9/542 (2013.01);
Abstract
A system for determining risky events includes an input interface and a processor. The input interface is for receiving sensor data on environmental conditions. The processor is for determining whether the environmental conditions indicate an increase in event probability and, in the event that environmental conditions indicate the increase in the event probability, adjusting an event detection threshold.
Quick Actions:
Quach, Quoc. (2023). Environmental condition-based risk level (U.S. Patent No. 11663508). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11663508
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile