The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2023

Filed:

Nov. 15, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Aaron K. Baughman, Cary, NC (US);

Michael Behrendt, Sindelfingen-Maichingen, DE;

Shikhar Kwatra, Durham, NC (US);

Craig M. Trim, Ventura, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2023.01); G06N 3/10 (2006.01); G06N 3/04 (2023.01); G06N 3/082 (2023.01);
U.S. Cl.
CPC ...
G06N 3/082 (2013.01); G06N 3/04 (2013.01); G06N 3/10 (2013.01);
Abstract

An autonomic function executing in an artificial intelligence environment determines that a fused model responsive to a new problem space has below a threshold level of accuracy in the new problem space. A spliced layer in the fused model is autonomically cloned, the spliced layer having been extracted from a second model and inserted at a location in the fused model. The cloned layer is autonomically inserted at a second location in the fused model. An automatically constructed vector transformation transforms an output vector of a previous layer in an immediately previous location in the model relative to the second location. The cloned layer is automatically fused in the fused model using the transformed output vector as input to the cloned layer, forming a deep fused model that has a revised accuracy that is higher than the accuracy relative to an ontology of the new problem space.


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