The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2023
Filed:
Nov. 05, 2020
Oracle International Corporation, Redwood Shores, CA (US);
Matthew T. Gerdes, Oakland, CA (US);
Kenny C. Gross, Escondido, CA (US);
Guang C. Wang, San Diego, CA (US);
Shreya Singh, La Jolla, CA (US);
Aleksey M. Urmanov, San Diego, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
During operation, the system uses N sensors to sample an electromagnetic interference (EMI) signal emitted by a target asset while the target asset is running a periodic workload, wherein each of the N sensors has a sensor sampling frequency f, and wherein the N sensors perform sampling operations in a round-robin ordering with phase offsets between successive samples. During the sampling operations, the system performs phase adjustments among the N sensors to maximize phase offsets between successive sensors in the round-robin ordering. Next, the system combines samples obtained through the N sensors to produce a target EMI signal having an EMI signal sampling frequency F=f×N. The system then generates a target EMI fingerprint from the target EMI signal. Finally, the system compares the target EMI fingerprint against a reference EMI fingerprint for the target asset to determine whether the target asset contains any unwanted electronic components.