The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2023

Filed:

May. 14, 2020
Applicant:

University of Florida Research Foundation, Inc., Gainesville, FL (US);

Inventors:

Grant Haydock Hernandez, Gainesville, FL (US);

Kevin R. Butler, Gainesville, FL (US);

Patrick G. Traynor, Gainesville, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01); G06F 11/36 (2006.01); H04W 28/06 (2009.01); H04W 92/10 (2009.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); G06F 11/3688 (2013.01); H04W 28/065 (2013.01); G06F 21/57 (2013.01); H04W 92/10 (2013.01);
Abstract

Various examples are provided related to automated security analysis of baseband firmware. In one example, a system includes a wireless front end and processing circuitry communicatively coupled to the wireless front end and a target device. The processing circuitry can generate mutated packets based upon a device state of the target device; provide the mutated packets for transmission to the target device; receive feedback information from the target device in response to reception of the mutated packets; and identify a firmware flaw associated with the target device in response to the feedback information. In another example, a method includes generating mutated packets based upon a device state of a target device; transmitting the mutated packets to the target device; receiving feedback information from the target device in response to reception of the mutated packets; and identifying a firmware flaw associated with the target device using the feedback information.


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