The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2023

Filed:

Oct. 22, 2020
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventor:

Matthew Bryan, Olympia, WA (US);

Assignee:

EMC IP HOLDING COMPANY LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 8/60 (2018.01);
U.S. Cl.
CPC ...
G06F 11/3664 (2013.01); G06F 8/60 (2013.01);
Abstract

Systems and methods facilitating selection of computer system deployments to mock for testing are described herein. A method as described herein can include filtering, by a first system operatively coupled to a processor, data relating to deployments of respective second systems as collected from the respective second systems, wherein the filtering is based on relevancy of the deployments to a testing criterion and results in a filtered group of deployments; grouping, by the first system, respective ones of the filtered group of deployments into respective clusters according to a difference function, the difference function being defined according to respective properties of the respective ones of the filtered group of deployments; and designating, by the first system, selected ones of the filtered group of deployments from respective ones of the clusters for testing according to a selection criterion.


Find Patent Forward Citations

Bryan, Matthew. (2023). Selection of computer system deployments to mock for testing (U.S. Patent No. 11663112). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11663112

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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