The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2023
Filed:
Jun. 08, 2021
Scenera, Inc., Palo Alto, CA (US);
David D. Lee, Palo Alto, CA (US);
Andrew Augustine Wajs, Haarlem, NL;
Scenera, Inc., Palo Alto, CA (US);
Abstract
A multi-layer technology stack includes a sensor layer including image sensors, a device layer, and a cloud layer, with interfaces between the layers. A method to curate different custom workflows for multiple applications include the following. Requirements for custom sets of data packages for the applications is received. The custom set of data packages include sensor data packages (e.g., SceneData) and contextual metadata packages that contextualize the sensor data packages (e.g., SceneMarks). Based on the received requirements and capabilities of components in the technology stack, the custom workflow for that application is deployed. This includes a selection, configuration and linking of components from the technology stack. The custom workflow is implemented in the components of the technology stack by transmitting workflow control packages directly and/or indirectly via the interfaces to the different layers.