The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2023

Filed:

Apr. 16, 2020
Applicant:

Cirrus Logic International Semiconductor Ltd., Edinburgh, GB;

Inventors:

Aleksey Khenkin, Austin, TX (US);

Jun Yan, Austin, TX (US);

Marco Janko, Austin, TX (US);

Michael McKnight, Austin, TX (US);

Assignee:

Cirrus Logic, Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/01 (2006.01); G01R 33/028 (2006.01); H02N 11/00 (2006.01); H02N 2/14 (2006.01); H02N 1/00 (2006.01); H01L 41/04 (2006.01); H01L 41/09 (2006.01); H01L 41/083 (2006.01);
U.S. Cl.
CPC ...
G06F 3/016 (2013.01); G01R 33/028 (2013.01); H02N 1/006 (2013.01); H02N 2/14 (2013.01); H02N 2/142 (2013.01); H02N 11/00 (2013.01); H01L 41/042 (2013.01); H01L 41/083 (2013.01); H01L 41/09 (2013.01);
Abstract

A method may include measuring an electrical parameter of an electromagnetic load having a moving mass during the absence of a driving signal actively driving the electromagnetic load, measuring a mechanical parameter of mechanical motion of a host device comprising the electromagnetic load, correlating a relationship between the mechanical parameter and the electrical parameter, and calibrating the electromagnetic load across a plurality of mechanical motion conditions based on the relationship.


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