The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2023

Filed:

Mar. 09, 2021
Applicant:

Evident Corporation, Nagano, JP;

Inventors:

Akifumi Kabeya, Tokyo, JP;

Tetsuya Shirota, Tokyo, JP;

Tatsuo Nakata, Tokyo, JP;

Assignee:

EVIDENT CORPORATION, Nagano, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G06T 7/00 (2017.01); G06T 11/60 (2006.01); H04N 7/18 (2006.01);
U.S. Cl.
CPC ...
G02B 21/365 (2013.01); G06T 7/0012 (2013.01); G06T 11/60 (2013.01); H04N 7/183 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/20084 (2013.01);
Abstract

A microscope systemincludes an eyepiece, an objectivethat guides light from a sample to the eyepiece, and a tube lensthat is disposed on a light path between the eyepieceand the objectiveand forms an optical image of the sample on the basis of light therefrom. The microscope systemfurther includes a projection apparatusthat projects first and second projection images onto an image plane on which the optical image is formed, in a manner such that the first and second projection images are capable of being distinguished from each other. The first projection image is based on an analysis result provided by a computer for the digital image data of the sample. The second projection image is based on an input operation performed by a user and includes at least input information provided by the user.


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