The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2023

Filed:

Jan. 07, 2020
Applicant:

Meta Platforms Technologies, Llc, Menlo Park, CA (US);

Inventors:

Andrew John Ouderkirk, Redmond, WA (US);

Tanya Malhotra, Redmond, WA (US);

Sheng Ye, Redmond, WA (US);

Liliana Ruiz Diaz, Redmond, WA (US);

Assignee:

Meta Platforms Technologies, LLC, Menlo Park, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 5/30 (2006.01); B29C 55/02 (2006.01); B29C 55/08 (2006.01); B29C 55/20 (2006.01);
U.S. Cl.
CPC ...
G02B 5/305 (2013.01); B29C 55/023 (2013.01); B29C 55/08 (2013.01); B29C 55/20 (2013.01); B29K 2995/0031 (2013.01); B29K 2995/0044 (2013.01); B29K 2995/0051 (2013.01); B29K 2995/0097 (2013.01);
Abstract

A polymer layer includes a first in-plane refractive index extending along a first direction of the polymer layer, a second in-plane refractive index less than the first in-plane refractive index extending along a second direction of the polymer layer orthogonal to the first direction, a third refractive index along a direction orthogonal to both the first direction and the second direction, and a plurality of wrinkles extending along a surface of the polymer layer, where a difference between the first in-plane refractive index and the second in-plane refractive index is at least approximately 0.05, and the third refractive index is greater than the second in-plane refractive index.


Find Patent Forward Citations

Loading…