The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2023

Filed:

Jun. 24, 2020
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Franz Michael Darrer, Graz, AT;

Martin Graefling, Graz, AT;

Boris Kirillov, Judendorf-Straßenge, AT;

Stefan Mendel, Graz, AT;

Christoph Steiner, St. Margarethen, AT;

Assignee:

Infineon Technologies AG, Neubiberg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/4863 (2020.01); G01S 7/4865 (2020.01); G01S 17/894 (2020.01); G01S 7/481 (2006.01); G01S 7/497 (2006.01);
U.S. Cl.
CPC ...
G01S 7/4863 (2013.01); G01S 7/481 (2013.01); G01S 7/4865 (2013.01); G01S 7/497 (2013.01); G01S 17/894 (2020.01);
Abstract

A method for determining malfunction is provided. The method includes receiving a 1D or 2D luminance image of a scene from a time-of-flight based 3D-camera. The luminance image includes one or more pixels representing intensities of background light received by an image sensor of the 3D-camera. The method further includes receiving a 2D optical image of the scene from an optical 2D-camera and comparing the luminance image to the optical image. If the luminance image does not match the optical image, the method additionally includes determining malfunction of one of the 3D-camera and the 2D-camera.


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