The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2023

Filed:

Feb. 05, 2021
Applicant:

Fluke Corporation, Everett, WA (US);

Inventors:

Ginger M. Woo, Shoreline, WA (US);

Gloria M. Chun, Seattle, WA (US);

Ricardo Rodriguez, Mill Creek, WA (US);

Ronald Steuer, Hinterbruhl, AT;

Assignee:

Fluke Corporation, Everett, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 15/18 (2006.01); H04Q 9/00 (2006.01);
U.S. Cl.
CPC ...
G01R 15/181 (2013.01); H04Q 9/00 (2013.01); H04Q 2209/40 (2013.01);
Abstract

A sensor probe includes a body having first and second channels that are spaced apart and extend through the body approximately parallel to each other. A first end of a Rogowski coil is fixed within the first channel. The Rogowski coil passes through the second channel and loops back to the first channel where a second end of the Rogowski coil is selectively insertable into the first channel opposite the first end of the Rogowski coil. A non-contact sensor coupled to the body is positioned between the first and second channels to measure a parameter of an insulated conductor situated within the loop formed by the Rogowski coil. The size of an interior region within the loop is selectively adjustable by sliding movement of the Rogowski coil within the second channel.


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