The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2023

Filed:

Dec. 12, 2019
Applicants:

Boston Scientific Scimed, Inc., Maple Grove, MN (US);

Regents of the University of Minnesota, Minneapolis, MN (US);

Inventors:

Gregory J. Sherwood, North Oaks, MN (US);

Justin Theodore Nelson, Minneapolis, MN (US);

Steven J. Koester, Edina, MN (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/02 (2006.01); G01N 27/22 (2006.01); G01N 33/00 (2006.01);
U.S. Cl.
CPC ...
G01N 27/021 (2013.01); G01N 27/221 (2013.01); G01N 27/227 (2013.01); G01N 33/0036 (2013.01);
Abstract

Embodiments herein include a kinetic response system for measuring analyte presence on a chemical sensor element. The chemical sensor element includes one or more discrete binding detectors, each discrete binding detector including a graphene varactor. The kinetic response system includes a measurement circuit having an excitation voltage generator for generating a series of excitation cycles over a time period. Each excitation cycle includes delivering a DC bias voltage to the discrete binding detectors at multiple discrete DC bias voltages across a range of DC bias voltages. The kinetic response system includes a capacitance sensor to measure capacitance of the discrete binding detectors resulting from the excitation cycles. The kinetic response system includes a controller circuit to determine the kinetics of change in at least one of a measured capacitance value and a calculated value based on the measured capacitance over the time period. Other embodiments are also included herein.


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