The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2023
Filed:
Jun. 08, 2018
Dow Global Technologies Llc, Midland, MI (US);
Donald L. McCarty, II, Midland, MI (US);
William E. Gee, Collegeville, PA (US);
Paul OConnell, Lake Jackson, TX (US);
Jonathan J. Zieman, Midland, MI (US);
John Lund, Midland, MI (US);
Hitendra Singh, Lake Jackson, TX (US);
Scott J. Collick, Midland, MI (US);
Dow Global Technologies LLC, Midland, MI (US);
Abstract
A method and system for analyzing a physical characteristic of a film sample are described herein. The system may include a material holder system configured to hold the film sample. The system may include a tensile testing system configured to stretch the film sample and determine a physical characteristic of the film sample. The system may include a movable system coupled to the material holder system and configured to move the held film sample to be analyzed or tested between stations. The movable system is configured to move the held film sample in the material holder system to the tensile testing system.