The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2023
Filed:
Jan. 29, 2020
Applicant:
Heraeus Electro-nite International N.v., Houthalen, BE;
Inventors:
Jan Cuypers, Houthalen, BE;
Jean-Paul Verhoeven, Houthalen, BE;
Assignee:
HERAEUS ELECTRO-NITE INTERNATIONAL N.V., Houthalen, BE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/12 (2006.01); G01N 33/2025 (2019.01); G01N 33/205 (2019.01);
U.S. Cl.
CPC ...
G01N 1/125 (2013.01); G01N 33/205 (2019.01); G01N 33/2025 (2019.01);
Abstract
The present invention relates to an apparatus for demolding and analyzing a direct analysis sample formed from a molten metal material contained within a sample chamber assembly, wherein the sample chamber assembly comprises at least a sample housing, a cover plate and closing means, comprising: The invention also relates to a system and method for demolding and analyzing a direct analysis sample.
Cuypers, Jan. (2023). Method and apparatus for demolding and analyzing a direct analysis sample (U.S. Patent No. 11662277). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11662277
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile