The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2023

Filed:

Dec. 15, 2021
Applicant:

Minebea Mitsumi Inc., Nagano, JP;

Inventor:

Shinya Yamaguchi, Tokyo, JP;

Assignee:

MINEBEA MITSUMI Inc., Nagano, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 1/18 (2006.01); G01L 5/162 (2020.01);
U.S. Cl.
CPC ...
G01L 5/162 (2013.01); G01L 1/18 (2013.01);
Abstract

A sensor chip includes multiple sensing blocks each of which includes two or more T-patterned beam structures. Each T-patterned beam structure includes strain-detecting elements, at least one first detection beam, and a second detection beam extending from the first detection beam in a direction perpendicular to the first detection beam. Each T-patterned beam structure includes a connection portion formed by coupling ends of second detection beams in respective T-patterned structures, the connection portion including a force point portion. The sensor chip is configured to detect up to six axes relating to predetermined axial forces or moments around the predetermined axes, based on a change in an output of each of the strain-detecting elements, the output of each strain-detecting element changing in accordance with an input applied to a given force point portion.


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