The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2023
Filed:
Mar. 07, 2022
Applicant:
Wavefront Research, Inc., Northampton, PA (US);
Inventor:
Thomas A. Mitchell, Arrington, TN (US);
Assignee:
Wavefront Research, Inc., Northampton, PA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01J 3/02 (2006.01); G01J 3/36 (2006.01); G01J 3/14 (2006.01); G01J 3/18 (2006.01);
U.S. Cl.
CPC ...
G01J 3/2823 (2013.01); G01J 3/02 (2013.01); G01J 3/0208 (2013.01); G01J 3/14 (2013.01); G01J 3/18 (2013.01); G01J 3/28 (2013.01); G01J 3/36 (2013.01); G01J 2003/2826 (2013.01);
Abstract
An imaging optical system including a plurality of imaging optical sub-systems, each having at least one optical element and receiving light from a source, and a plurality of spectrometer optical sub-systems, each spectrometer optical sub-system receiving light from at least one of the imaging optical sub-systems, each imaging optical sub-system and spectrometer optical sub-system combination having a spatial distortion characteristic, each spatial distortion characteristic having a predetermined relationship to the other spatial distortion characteristics.