The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2023

Filed:

Oct. 02, 2020
Applicant:

Okuma Corporation, Niwa-Gun, JP;

Inventor:

Reiji Kanbe, Niwa-Gun, JP;

Assignee:

Okuma Corporation, Niwa-Gun, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/00 (2006.01); G01B 5/008 (2006.01);
U.S. Cl.
CPC ...
G01B 11/005 (2013.01); G01B 5/008 (2013.01);
Abstract

A correction value measurement method includes, measuring a position of a reference sphere, calculating a relative position of the reference sphere with respect to a sensing position from the position of the reference sphere, a length of the position measurement sensor, and a length of the reference tool. The method further includes acquiring a reference tool position as a distal end position of the reference tool using, calculating a length direction correction value of the position measurement sensor from the reference tool position, the position of the reference sphere, the relative position, and a length of the reference tool, and measuring the position of the reference sphere to calculate a radial direction correction value of the position measurement sensor.


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