The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2023

Filed:

Feb. 04, 2019
Applicant:

Taikisha Ltd., Tokyo, JP;

Inventors:

Hideo Shiwa, Tokyo, JP;

Genji Nakayama, Tokyo, JP;

Yoshio Higashi, Tokyo, JP;

Assignee:

Taikisha Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B24B 51/00 (2006.01); B24B 19/26 (2006.01); B24B 27/00 (2006.01); B24B 49/12 (2006.01);
U.S. Cl.
CPC ...
B24B 51/00 (2013.01); B24B 19/26 (2013.01); B24B 27/0076 (2013.01); B24B 49/12 (2013.01);
Abstract

In an automatic polishing system configured such that under control of a polishing robot and/or a polishing tool by a polishing controller, the polishing tool provides a polishing action on a polishing subject face, a color intensity measurement instrument is provided for measuring an intensity of a specified color in the polishing subject face. Based on the intensity of the specified color measured by this color intensity measurement instrument, the polishing controller controls the polishing robot and/or the polishing tool, so that an amount of polishing work by the polishing tool onto the polishing subject face is adjusted according to the intensity of the specified color.


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