The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2023

Filed:

Dec. 21, 2016
Applicant:

The University of Sheffield, Sheffield, GB;

Inventors:

Dilichukwu Anumba, Sheffield, GB;

Timothy James Healey, Sheffield, GB;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/0538 (2021.01); A61B 5/00 (2006.01); G01R 35/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/6843 (2013.01); A61B 5/0538 (2013.01); A61B 5/4331 (2013.01); G01R 35/005 (2013.01); A61B 5/435 (2013.01); A61B 2562/0219 (2013.01); A61B 2562/0252 (2013.01); A61B 2562/0261 (2013.01);
Abstract

An apparatus for determining a force Fapplied to a tip of an electrical impedance spectroscopy probe includes a load cell, accelerometer, and a processing means. The probe tip has a substantially planar distal end for contacting human or animal tissue. The load cell measures the force Fapplied axially along a longitudinal axis when the probe tip is in contact with human or animal tissue. The accelerometer measures a gravity vector A. The apparatus includes a means for compensating for the mass of the probe tip using the measured force and the gravity vector to produce a calibrated measurement force F applied to the probe tip.


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