The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2023
Filed:
Jun. 04, 2021
Applicant:
Photono Oy, Helsinki, FI;
Inventors:
Antti Kontiola, Helsinki, FI;
Edward Häggström, Helsinki, FI;
Ari Salmi, Helsinki, FI;
Heikki Nieminen, Helsinki, FI;
Assignee:
PHOTONO OY, Helsinki, FI;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/16 (2006.01); A61B 5/00 (2006.01); A61B 8/10 (2006.01); A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
A61B 3/165 (2013.01); A61B 5/0051 (2013.01); A61B 8/10 (2013.01); A61B 3/102 (2013.01);
Abstract
An intraocular pressure measurement arrangement is disclosed for measuring pressure of an eye of a patient. The arrangement can include at least one source for producing mechanical waves of several frequencies from a distance to the eye of the patient to generate at least one surface wave to the eye, a detector for detecting at least one surface wave from a distance from the eye to extract surface wave information, and a device for determining pressure information of the eye based on the surface wave information.