The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2023
Filed:
Sep. 10, 2020
Applicant:
Nidek Co., Ltd., Aichi, JP;
Inventors:
Shirohisa Kobayashi, Aichi, JP;
Kunio Suzuki, Aichi, JP;
Hiroyoshi Nakanishi, Aichi, JP;
Kazunari Shimizu, Aichi, JP;
Assignee:
NIDEK CO., LTD., Aichi, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/00 (2006.01); A61B 3/10 (2006.01); A61B 3/15 (2006.01); A61B 3/16 (2006.01);
U.S. Cl.
CPC ...
A61B 3/0058 (2013.01); A61B 3/005 (2013.01); A61B 3/102 (2013.01); A61B 3/1025 (2013.01); A61B 3/152 (2013.01); A61B 3/16 (2013.01);
Abstract
Provided is an ophthalmic apparatus for examining an examinee's eye, including: an examination device configured to examine the examinee's eye; an approacher in the examination device, configured to approach the examinee; a detector configured to detect approach of the approacher to the examinee; and a controller configured to switch an operation mode between a first mode where an avoidance operation for avoiding the approach is performed and a second mode where the avoidance operation is not performed, upon the detector detecting the approach.