The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2023

Filed:

Mar. 04, 2021
Applicant:

Carl Zeiss Industrielle Messtechnik Gmbh, Oberkochen, DE;

Inventors:

Stephan Rieger, Oberkochen, DE;

Lionel Martz, Oberkochen, DE;

Tobias Feldengut, Düsseldorf, DE;

Erich Michler, Kirchheim Am Ries, DE;

Kilian Neumaier, Heidenheim, DE;

Markus Ritter, Heidenheim, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01); G01B 11/00 (2006.01);
U.S. Cl.
CPC ...
H04N 5/23216 (2013.01); G01B 11/005 (2013.01); H04N 5/23299 (2018.08);
Abstract

An optical measuring device includes at least one optical sensor configured for optical capture of at least one measurement object at multiple image recording positions. The optical measuring device includes at least one display device configured to display, for multiple predetermined and/or determinable image recording positions, in each case a schematic representation of an image to be recorded at the respective image recording position. The optical measuring device includes at least one data processing unit and at least one interface. The interface is configured to provide at least one item of manipulation information to the data processing unit. The data processing unit is configured to, based on the manipulation information, adapt at least one of the image recording position and an image recording parameter of at least one of the images to be recorded.


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