The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2023

Filed:

Dec. 20, 2021
Applicant:

Allegro Microsystems, Llc, Manchester, NH (US);

Inventors:

Anton Babushkin, Kyiv, UA;

Serhii Korol, Kyiv, UA;

Yaroslav Smirnov, Kyiv, UA;

Dmytro Sakharov, Kyiv, UA;

Masahira Kurihara, Prague, CZ;

Kamyar Khosravi, Manchester, NH (US);

Vadym Khudobets, Kyiv, UA;

Assignee:

Allegro MicroSystems, LLC, Manchester, NH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02P 23/14 (2006.01); G01R 29/02 (2006.01); H02P 29/00 (2016.01);
U.S. Cl.
CPC ...
H02P 23/14 (2013.01); G01R 29/02 (2013.01); H02P 29/00 (2013.01);
Abstract

A method comprising: receiving a first current measurement that is taken at a first predetermined time instant; receiving a second current measurement that is taken at a second predetermined time instant; classifying the first current measurement as corresponding to one of a plurality of electrical signals, the first current measurement being classified based, at least in part, on a duty cycle pattern of the plurality of electrical signals; classifying the second current measurement as corresponding to another one of the plurality of electrical signals, the second current measurement being classified based, at least in part, on the duty cycle pattern of the plurality of electrical signals; and adjusting a duty cycle of at least one of the electrical signals based on the first current measurement, the classification of the first current measurement, the second current measurement, and the classification of the second current measurement.


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Babushkin, Anton. (2023). Single-shunt current measurement (U.S. Patent No. 11658597). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11658597

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