The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2023

Filed:

Mar. 15, 2021
Applicants:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Toshiba Electronic Devices & Storage Corporation, Tokyo, JP;

Inventors:

Noboru Yokoyama, Hakusan Ishikawa, JP;

Kazuyuki Sato, Nonoichi Ishikawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/66 (2006.01); H01L 29/66 (2006.01); H01L 21/02 (2006.01); H01L 21/308 (2006.01);
U.S. Cl.
CPC ...
H01L 22/12 (2013.01); H01L 21/0254 (2013.01); H01L 21/02529 (2013.01); H01L 21/02532 (2013.01); H01L 21/308 (2013.01); H01L 29/66734 (2013.01);
Abstract

According to one embodiment, a method for manufacturing a semiconductor member is disclosed. The method can include measuring a first mass of a semiconductor substrate including a first semiconductor layer of a first conductivity type. The method can include forming a first opening in an upper surface of the first semiconductor layer. The method can include measuring a second mass of the semiconductor substrate in which the first opening is formed. In addition, the method can include when forming a second semiconductor layer of a second conductivity type in the first opening, changing an impurity concentration of the second conductivity type in the second semiconductor layer according to a difference in mass between the first mass and the second mass.


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