The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2023
Filed:
Jun. 08, 2020
Idemia Identity & Security Usa Llc, Billerica, MA (US);
Darrell Hougen, Littleton, CO (US);
Peter Zhen-Ping Lo, Mission Viejo, CA (US);
IDEMIA IDENTITY & SECURITY USA LLC, Billerica, MA (US);
Abstract
In some implementations, a method includes: receiving, from the camera, a sample image that includes a fingerprint and a mensuration reference device, where the sample image is associated with a resolution; identifying (i) a plurality of edge candidate groups within the sample image, and (ii) a set of regularity characteristics associated with each of the plurality of edge candidate groups; determining that the associated set of regularity characteristics indicates the mensuration reference device; identifying a ruler candidate group, from each of the plurality of edge candidate groups, based at least on determining that the associated set of regularity characteristics indicates the mensuration reference device; computing a scale associated with the sample image based at least on extracting a set of ruler marks from the identified ruler candidate group; and generating, based at least on the scale associated with the sample image, a scaled image.