The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2023

Filed:

Jan. 26, 2021
Applicant:

Siemens Healthcare Gmbh, Erlangen, DE;

Inventors:

Marcus Pfister, Bubenreuth, DE;

Katharina Breininger, Erlangen, DE;

Patrick Loeber, Erlangen, DE;

Assignee:

Siemens Healthcare GmbH, Erlangen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/33 (2017.01); G06T 5/00 (2006.01); G06T 3/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/337 (2017.01); G06T 3/0068 (2013.01); G06T 5/006 (2013.01); G06T 2207/20081 (2013.01);
Abstract

A method for deformation correction includes receiving a preoperative 3D image data set from an examination region of an examination object, generating a segmented 3D image data set by segmenting an anatomical structure in the preoperative 3D image data set, and acquiring image data from the examination region. A medical object is arranged in the examination region. The medical object is identified in the image data, and the segmented 3D image data set is registered with the image data. An overlay data set is generated and displayed based on the segmented 3D image data set and the image data. A position of a deviation between the image data and the segmented 3D image data set is defined, and a deformation rule is determined for the reduction of the deviation between the image data and the segmented 3D image data set. The corrected overlay data set is generated and provided.


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